Scanning Electron Microscope
Scanning Electron Microscope, abbreviated as SEM, is a high-precision research instrument for ultra-high resolution micro-morphology analysis. It is used to observe micron and nano-scale microstructures of NdFeB magnets, analyze grain morphology, fracture defects, coating interfaces, corrosion morphology and impurity composition. It serves as the core high-end physical and chemical analysis equipment for magnet formula R&D, sintering process optimization, failure analysis and quality traceability.
Working Principle
The instrument emits a focused high-energy electron beam to scan the sample surface point by point. When the electron beam bombards the sample, signals such as secondary electrons and backscattered electrons are excited. Detectors collect these signals and convert them into image signals. After system processing, ultra-high magnification micro surface morphology images are displayed on the monitor. Equipped with EDS attachment, it can also analyze the type and content of elements in designated micro areas, realizing integrated morphology observation and composition analysis.
Main Applications
Observe grain size, grain uniformity and grain boundary phase distribution of sintered NdFeB, evaluate the rationality of sintering parameters such as sintering temperature and holding time.
Analyze the micro-morphology of chipping, cracking and brittle fracture sections, locate fracture triggers and identify root causes of defects from raw materials, cutting and sintering processes.
Inspect cross-section structure of electroplated coatings, check coating thickness, pinholes, voids, peeling and interfacial bonding status to optimize anti-corrosion surface treatment processes.
Analyze corrosion micro-morphology after salt spray and HAST aging tests, study corrosion mechanisms and verify the anti-corrosion performance of products.
Identify tiny inclusions, foreign matters and oxidation spots on samples. Combine with EDS to analyze impurity elements and trace contamination from incoming materials and production.
Support new material formula development, new process verification, high-level customer factory audits and product failure review analysis.
Core Equipment Advantages
Wide magnification range. One-click switch from low-magnification overview observation to high-magnification micro-detail inspection with outstanding resolution and clear micro features. Strong stereoscopic perception. Compared with metallographic microscopes, it presents distinct layers of surface relief and higher defect recognition rate. Simple sample preparation. Conductive samples can be loaded quickly for observation with simple and efficient testing procedures. Simultaneous morphology observation and micro-area elemental analysis, enabling both structural visualization and composition identification to meet in-depth failure analysis requirements. Benchtop model with small footprint, high stability and vibration resistance, suitable for routine long-term laboratory analysis. Intelligent operation interface. Convenient for image capture, scale marking, data saving and export. Standard and complete test reports are widely recognized in the industry.
Supporting Production Sequence
Sampling & specimen preparation for abnormal products → SEM micro-morphology observation + micro-area composition analysis → Root cause identification → Targeted optimization for sintering, electroplating and machining processes